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Advances in transducers, equipment and data processing to improve the reliability of NDT. Tuesday, 4 December 1990 / organised by Professional Group S6 (Non-destructive Testing).

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Format:
Book
Contributor:
IEEE Xplore (Online service)
Institution of Electrical Engineers. Science, Education, and Management Division.
Institution of Electrical Engineers. Professional Group S6 (Non-destructive Testing)
Series:
Colloquium (Institution of Electrical Engineers) ; no. 90/172.
IEE colloquium ; digest no. 1990/172
Language:
English
Subjects (All):
Nondestructive testing--Congresses.
Nondestructive testing.
Signal processing--Digital techniques--Congresses.
Signal processing.
Signal processing--Digital techniques.
Transducers--Congresses.
Transducers.
Genre:
Conference papers and proceedings.
Physical Description:
1 volume (various pagings).
Place of Publication:
London : Institution of Electrical Engineers, 1990.
System Details:
Mode of access: World Wide Web.
text file
Notes:
At head of title: Science Education and Technology Division.
OCLC:
35507260
Access Restriction:
Restricted for use by site license.

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