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14th IEEE VLSI Test Symposium. April 28-May 1, 1996, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (14th : 1996 : Princeton, N.J.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxix, 510 pages : illustrations
- Other Title:
- Fourteenth IEEE VLSI Test Symposium
- VLSI Test Symposium, 1996, proceedings of 14th.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Press order number PR07304"--T.p. verso.
- "IEEE Order Plan number 96TB100043"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0818673044
- 9780818673047
- 0818673060
- 9780818673061
- OCLC:
- 35160224
- Access Restriction:
- Restricted for use by site license.
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