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Annual Reliability and Maintainability Symposium. 1995 proceedings, Washington, D.C., USA, 1995 January 16-19.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
Conference Name:
Reliability and Maintainability Symposium (1995 : Washington, D.C.)
Language:
English
Subjects (All):
Reliability (Engineering)--Congresses.
Reliability (Engineering).
Maintainability (Engineering)--Congresses.
Maintainability (Engineering).
Genre:
Conference papers and proceedings.
Physical Description:
xx, 535, cx-101 pages : illustrations
Other Title:
1995 Reliability and maintainability symposium
1995 proceedings Annual Reliability and Maintainability Symposium
Reliability and Maintainability Symposium, 1995, proceedings, Annual.
Place of Publication:
[New York] : Institute of Electrical and Electronics Engineers, [1995]
System Details:
Mode of access: World Wide Web.
text file
Notes:
IEEE catalog no. 95CH35743.
"Theme: Reliability & maintainability - the next generation"--T.p. verso.
Includes bibliographical references and indexes.
ISBN:
0780324706
9780780324701
0780324714
9780780324718
0780324722
9780780324725
OCLC:
32116593
Access Restriction:
Restricted for use by site license.

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