2 options
1994 proceedings. the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Québec, Canada / sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- International Workshop on Defect and Fault Tolerance in VLSI Systems (1994 : Montréal, Québec)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- x, 299 pages : illustrations
- Other Title:
- IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
- Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
- Defect and Fault Tolerance in VLSI Systems
- Defect and Fault Tolerance in VLSI Systems, 1994, proceedings, The IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Press order number 6307-02."
- "IEEE catalog number 94TH8009"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0818663073
- 9780818663079
- 0818663065
- 9780818663062
- OCLC:
- 31531682
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.