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Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (1994 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Semiconductor storage devices.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 141 pages : illustrations
- Other Title:
- Memory Technology, Design and Testing, 1994, records of the IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE catalog number 94TH0656-9"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 081866245X
- 9780818662454
- 0818662468
- 9780818662461
- OCLC:
- 31189400
- Access Restriction:
- Restricted for use by site license.
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