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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California / edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Semiconductor storage devices.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 143 pages : illustrations
- Other Title:
- Memory Testing, 1993, records of the 1993 IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE catalog number 93TH0554-6"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0818641509
- 9780818641503
- OCLC:
- 30362647
- Access Restriction:
- Restricted for use by site license.
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