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Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China / sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with China Computer Federation (CCF) ... [and others].
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (2nd : 1993 : Beijing, China)
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Electronic circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xii, 341 pages : illustrations
- Other Title:
- Test Symposium, 1993, proceedings of the Second Asian.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1993]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE catalog number 93TH0564-5"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 081863930X
- 9780818639302
- 0818639318
- 9780818639319
- OCLC:
- 29920211
- Access Restriction:
- Restricted for use by site license.
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