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Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Semiconductor Thermal Measurement and Management Symposium (9th : 1993 : Austin, Tex.)
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties--Congresses.
- Semiconductors.
- Semiconductors--Cooling--Congresses.
- Semiconductors--Cooling.
- Semiconductors--Thermal properties.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- x, 214 pages : illustrations
- Other Title:
- 9th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
- SEMI-THERM 1993
- Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.
- Place of Publication:
- New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.) : IEEE ; Piscataway, NJ : Additional copies from IEEE Service Center, [1993]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
- "1993 cumulative bibliography of articles on semiconductor thermal and temperature testing" / compiled by Bernard Siegal: pages 194-211.
- Includes bibliographical references.
- "IEEE catalog number 93CH3226-8"--T.p. verso.
- ISBN:
- 0780308646
- 9780780308640
- 0780308638
- 9780780308633
- 0780308654
- 9780780308657
- OCLC:
- 27691069
- Access Restriction:
- Restricted for use by site license.
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