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ICMTS 1990. proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, Calif. / sponsored by the IEEE Electron Devices Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures (1990 : San Diego, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- x, 244 pages : illustrations
- Other Title:
- Proceedings of the 1990 International Conference on Microelectronic Test Structures
- Microelectronic Test Structures, 1990, ICMTS 1990, proceedings of the 1990 International Conference on.
- Place of Publication:
- New York, NY : Institute of Electrical and Electronics Engineers, [1990]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Includes bibliographical references and index.
- "90CH2797-9."
- OCLC:
- 21947863
- Access Restriction:
- Restricted for use by site license.
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