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1994 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems. proceedings, May 16-20, 1994, Vanderbilt University, Nashville, Tennessee, USA.

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Format:
Book
Conference/Event
Contributor:
ACM Digital Library.
ACM-Sigmetrics
Conference Name:
Conference on Measurement and Modeling of Computer Systems (1994 : Nashville, Tenn.)
Series:
ACM Digital Library (Series)
Performance evaluation review ; v. 22, no. 1.
Performance evaluation review ; v. 22, no. 1
Language:
English
Subjects (All):
Electronic digital computers--Evaluation--Congresses.
Electronic digital computers.
Electronic digital computers--Evaluation.
Computer simulation--Congresses.
Computer simulation.
Genre:
Conference papers and proceedings.
Physical Description:
xi, 294 pages : illustrations.
Other Title:
Also known as: SIGMETRICS '94
Proceedings of the 1994 Conference on Measurement and Modeling of Computer Systems.
Place of Publication:
New York, N.Y. : Association for Computing Machinery, [1994]
System Details:
Mode of access: World Wide Web.
text file
Notes:
"Special issue."
"ACM order number 488940"--T.p. verso.
Includes bibliographical references and index.
ISBN:
089791659X
9780897916592
OCLC:
30962843
Access Restriction:
Restricted for use by site license.

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