Surface and interface analysis : an electrochemist's toolbox / by Rudolf Holze.

Format:

Book

Author/Creator:

Holze, R. (Rudolf), 1954-

Series:

Springer series in chemical physics ; v. 74.

Springer series in chemical physics ; 74

Language:

English

Subjects (All):

Surfaces (Physics)--Analysis.

Surfaces (Physics).

Interfaces (Physical sciences)--Analysis.

Interfaces (Physical sciences).

Surface chemistry.

Electrochemistry.

Physical Description:

xxii, 300 pages : illustrations (partly color) ; 24 cm.

Other Title:

Electrochemist's toolbox

Place of Publication:

Berlin : Springer, 2009.

Summary:

A broad, almost encyclopedic overview of spectroscopic and other analytical techniques useful for investigations of phase boundaries in electrochemistry is presented. The analysis of electrochemical interfaces and interphases on a microscopic, even molecular level, is of central importance for an improved understanding of the structure and dynamics of these phase boundaries. The gained knowledge will be needed for improvements of methods and applications reaching from electrocatalysis, electrochemical energy conversion, biocompatibility of metals, corrosion protection to galvanic surface treatment and finishing. The book provides an overview as complete as possible and enables the reader to choose methods most suitable for tackling his particular task. It is nevertheless compact and does not flood the reader with the details of review papers.

Contents:

2 Structure and Dynamics of Electrochemical Phase Boundaries 7

3 Scope and Limitations of Classical Electrochemical Methods 9

4 Spectroscopy and Surface Analysis at Interfaces Between Condensed Phases 13

Part II Methods and Applications

5 Spectroscopy at Electrochemical Interfaces 35

5.1 Optical Spectroscopy in the Visible Range 37

5.1.1 UV-Vis Spectroscopy with Optically Transparent Electrodes 38

5.1.2 External Reflectance Spectroscopy 43

5.1.3 Attenuated Total Reflectance Spectroscopy 45

5.1.4 Luminescence Spectroscopy 47

5.1.5 Fluorescence Spectroscopy 48

5.1.6 Electroreflectance Spectroscopy (ERS) 50

5.1.7 Diffuse Reflectance Spectroscopy 57

5.1.8 Reflection Anisotropy Spectroscopy 58

5.1.9 Photoacoustic Spectroscopy (PAS) 60

5.1.10 Photothermal Spectroscopy (PTS) 62

5.1.11 Circular Dichroism (CD) 64

5.1.12 Near Infrared Spectroscopy 65

5.2 Optical Spectroscopy in the Infrared Range 71

5.2.1 Infrared Transmission Spectroscopy with Thin Layer Cells 74

5.2.2 Infrared Reflection Spectroscopy 75

5.2.3 External Reflection Spectroscopy 76

5.2.4 Attenuated Total Reflection Spectroscopy 91

5.2.5 Surface Enhanced Infrared Absorption Spectroscopy (SEIRAS) 94

5.2.6 Diffuse Reflectance Infrared Spectroscopy (DRIFT) 100

5.2.7 Photothermal Deflection Spectroscopy (PDS) 100

5.2.8 Infrared Emission Spectroscopy 101

5.2.9 Far Infrared Spectroscopy 102

5.2.10 Raman Spectroscopy 103

5.2.11 Surface Raman Spectroscopy (SRS) 104

5.2.12 Surface Enhanced Raman Spectroscopy (SERS) 104

5.2.13 Surface Enhanced Hyper-Raman Spectroscopy (SEHRS) 123

5.2.14 Surface Resonance Raman Spectroscopy (SRRS) 125

5.2.15 Confocal Raman Spectroscopy 128

5.2.16 Near Field Raman Microscopy (Micro-Spectroscopy) 130

5.3 Spectroscopy in the X-ray Range 131

5.3.1 Mossbauer Spectroscopy 131

5.3.2 X-Ray Absorption Spectroscopy 137

5.3.3 X-Ray Absorption Fine Structure Spectroscopy 137

5.4 Magnetic Resonance Spectroscopy 143

5.5 Magnetooptic and Magnetic Methods 159

5.5.1 Magnetic Circular Dichroism 159

5.5.2 Magneto-Optical Kerr Effect (MOKE) 160

5.5.3 Alternating Gradient Field Magnetometry (AGFM) 162

5.5.4 SQUID Magnetometry 163

5.6 Photoelectrochemical Methods 164

5.6.1 Photoemission Spectroscopy 164

5.6.2 Photocurrent Spectroscopy (PCS) 165

5.6.3 Photovoltage Spectroscopy (PVS) 170

5.6.4 Photoluminescence (PL) 171

5.6.5 Micro-Optical Ring Electrode (MORE) 172

5.7 Nonlinear Optical Methods 173

5.7.1 Second Harmonic Generation (SHG) 173

5.7.2 Sum and Difference Frequency Generation 175

5.8 Mass Spectrometry 178

5.8.1 Differential Electrochemical Mass Spectrometry (DEMS) 178

5.8.2 Electrospray Mass Spectrometry 180

5.8.3 Thermospray Mass Spectrometry 182

5.8.4 Inductively Coupled Plasma Mass Spectrometry (ICPMS) 183

5.8.5 Thermodesorption Mass Spectrometry (TDMS) 183

5.9 Miscellaneous Spectroscopies and Methods 184

5.9.1 Probe beam deflection (PBD) 184

5.9.2 Light Reflection Method 189

5.9.3 Phase-Shift Interferometry 190

5.9.4 Photoacoustic Methods 190

5.9.5 Ellipsometry 192

5.9.6 Surface Plasmon Resonance Spectroscopy 195

5.9.7 Surface Plasmon Excitation and Related Methods 199

5.9.8 Inductively Coupled Plasma Atomic Emission Spectroelectrochemistry 200

5.9.9 Positron Annihilation Spectroscopy (PAS) 201

5.9.10 Neutron Reflectivity 202

5.9.11 Neutron Scattering 203

6 Diffraction and Other X-Ray Methods 233

6.1 X-Ray Diffraction Methods 233

6.1.1 X-Ray Diffraction 234

6.1.2 Surface X-Ray Diffraction (SXD) 239

6.1.3 Surface Differential X-Ray Diffraction (SDD) 240

6.1.4 Neutron Diffraction 240

6.2 Miscellaneous Methods 241

6.2.1 X-ray Standing Wave Fluorescence Analysis (XSW) 241

6.2.2 Surface X-ray Scattering (SXS) 242

6.2.3 Small Angle X-ray Scattering (SAXS) 245

6.2.4 Specular X-ray Reflection 246

7 Surface Analytical Methods 251

7.1 Topographic Methods 251

7.2 Scanning Probe Methods 252

7.2.1 Scanning Tunneling Microscopy (STM) 253

7.2.2 Differential Conductance Tunneling Spectroscopy (DCTS) 260

7.2.3 Atomic Force Microscopy (AFM) 260

7.2.4 Scanning Kelvin Probe Force Microscopy (SKPFM) 263

7.2.5 Scanning Electrochemical Microscopy (SECM) 264

7.2.6 pH-Microscopy 270

7.2.7 Scanning Ion-Conductance Microscopy 271

7.2.8 Scanning Reference Electrode Technique (SRET) 271

7.2.9 Scanning Vibrating Electrode Technique (SVET) 272

7.2.10 Scanning Kelvin Probe (SKP) 273

7.2.11 Scanning Tunneling Spectroscopy and Related Methods 277

7.3 Near Field and Confocal Optical Methods 279

7.3.1 Near Field Methods 280

7.3.2 Confocal Optical Methods 280

7.4 Surface Conductivity Measurements 281

7.5 Interfacial Conductivity Measurements 285

7.6 Microradiology 286.

Notes:

Includes bibliographical references and index.

ISBN:

9783540008590

3540008594

OCLC:

314124112