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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.
LIBRA TK7874.654 .T47 2008
Available from offsite location
- Format:
- Book
- Series:
- IET circuits, devices and systems series ; 19.
- Circuits, devices and systems series ; 19
- Language:
- English
- Subjects (All):
- Linear integrated circuits--Testing.
- Linear integrated circuits.
- Mixed signal circuits--Testing.
- Mixed signal circuits.
- Radio frequency integrated circuits--Testing.
- Radio frequency integrated circuits.
- Testing.
- Physical Description:
- xx, 389 pages : illustrations ; 24 cm.
- Place of Publication:
- London : Institution of Engineering and Technology, 2008.
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 9780863417450
- 0863417450
- OCLC:
- 180473599
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