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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev.
LIBRA TK7871.99.M44 P38 2008
Available from offsite location
- Format:
- Book
- Author/Creator:
- Pavlov, Andrei, Ph. D.
- Series:
- Frontiers in electronic testing ; 40.
- Frontiers in electronic testing ; 40
- Language:
- English
- Subjects (All):
- Metal oxide semiconductors, Complementary--Design.
- Metal oxide semiconductors, Complementary.
- Random access memory.
- Nanoelectronics.
- Physical Description:
- xvi, 193 pages : illustrations ; 25 cm.
- Place of Publication:
- [Dordrecht] : Springer, [2008]
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 9781402083624
- 1402083629
- 1402083637
- 9781402083631
- OCLC:
- 214308378
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