1 option
Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 / editors, A. Benninghoven ... [and others].
LIBRA QD96.M3 I57 1979
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- International Conference on Secondary Ion Mass Spectrometry, 2d, Stanford University, 1979.
- Series:
- Springer series in chemical physics ; 9.
- Springer series in chemical physics ; 9
- Language:
- English
- Subjects (All):
- Mass spectrometry--Congresses.
- Mass spectrometry.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiii, 298 pages : illustrations ; 24 cm.
- Place of Publication:
- New York : Springer-Verlag, 1979.
- Notes:
- Includes bibliographical references and index.
- OCLC:
- 5676272
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.