My Account Log in

1 option

Reliability of MEMS / edited by Osamu Tabata and Toshiyuki Tsuchiya.

LIBRA TK7875 .R45 2008
Loading location information...

Available from offsite location This item is stored in our repository but can be checked out.

Log in to request item
Format:
Book
Contributor:
Tsuchiya, Toshiyuki.
Tabata, Osamu, 1956-
Series:
Advanced micro & nanosystems ; v. 6.
Advanced micro & nanosystems ; v. 6
Language:
English
Subjects (All):
Microelectromechanical systems--Reliability.
Microelectromechanical systems.
Reliability.
Physical Description:
xx, 303 pages : illustrations ; 25 cm.
Place of Publication:
Weinheim : Wiley-VCH, 2008.
Notes:
"Testing of materials and devices"--Cover.
Includes bibliographical references and index.
ISBN:
3527314946
9783527314942
OCLC:
188552319

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account