Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / H.R. Verma.

Format:

Book

Author/Creator:

Verma, H. R.

Language:

English

Subjects (All):

Spectrum analysis.

Particles (Nuclear physics).

Physical Description:

xiv, 375 pages : illustrations ; 24 cm

Place of Publication:

Berlin ; New York : Springer, [2007]

Summary:

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), M??ssbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.

Notes:

Includes bibliographical references (pages [341]-364) and index.

ISBN:

9783540302773

3540302778

OCLC:

85842084