1 option
Proceedings / Advanced Techniques in Failure Analysis Symposium, 1976, 20-21 February 1976, Sheraton Hotel, Newport Beach, California, USA ; sponsored by the IEEE Reliability Group, G7, Los Angeles Chapter ... [and others].
LIBRA TK7871.85 .A38 1976
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Advanced Techniques in Failure Analysis Symposium, Newport Beach, Calif., 1976.
- Language:
- English
- Subjects (All):
- Semiconductors--Defects--Congresses.
- Semiconductors.
- Semiconductors--Defects.
- Semiconductors--Testing--Congresses.
- Semiconductors--Testing.
- Microscopy--Congresses.
- Microscopy.
- Microscopes--Congresses.
- Microscopes.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- iii, 116 pages : illustrations ; 28 cm
- Other Title:
- Failure analysis.
- Place of Publication:
- New York, N.Y, : Los Angeles Chapters of the Reliability and Parts, Hybrids & Packaging Groups, Institute of Electrical and Electronics Engineers, [1976]
- Notes:
- Includes bibliographical references.
- OCLC:
- 2654499
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.