Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.

Format:

Book

Author/Creator:

Joy, David C., 1943-

Contributor:

Alumni and Friends Memorial Book Fund.

Series:

Oxford series in optical and imaging sciences ; 9.

Oxford series in optical and imaging sciences ; 9

Language:

English

Subjects (All):

Electron microscopy--Computer simulation.

Electron microscopy.

Electron probe microanalysis--Computer simulation.

Electron probe microanalysis.

Monte Carlo method.

Physical Description:

viii, 216 pages : illustrations ; 25 cm.

Place of Publication:

New York : Oxford University Press, 1995.

Summary:

This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

Notes:

Includes bibliographical references.

Local Notes:

Acquired for the Penn Libraries with assistance from the Alumni and Friends Memorial Book Fund.

ISBN:

0195088743

OCLC:

31287442

Online:

Publisher description