Semiconductor material and device characterization / Dieter K. Schroder.

Format:

Book

Author/Creator:

Schroder, Dieter K.

Contributor:

Class of 1932 Fund.

Language:

English

Subjects (All):

Semiconductors.

Semiconductors--Testing.

Physical Description:

xv, 779 pages : illustrations ; 25 cm

Edition:

Third edition.

Place of Publication:

[Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, [2006]

Summary:

Semiconductor Material and Device Characterizationis the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references. * New end of chapter problems * Outdated figures have been redone and replaced with current data * Up-to-date bibliography with over 1400 references * Professor Schroder is recognized as the authority in the field of semiconductor characterization

Notes:

"Wiley-Interscience."

Includes bibliographical references and index.

Local Notes:

Acquired for the Penn Libraries with assistance from the Class of 1932 Fund.

ISBN:

0471739065

OCLC:

59360243

Publisher Number:

9780471739067