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Memory & LSI : digest of papers / 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey ; sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
LIBRA TK7874 .S42 1977
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Semiconductor Test Symposium. 8th, Cherry Hill, N.J., 1977.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Large scale integration--Congresses.
- Integrated circuits--Large scale integration.
- Semiconductor storage devices--Testing.
- Semiconductor storage devices.
- Microprocessors--Testing--Congresses.
- Microprocessors.
- Microprocessors--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- x, 198 pages : illustrations ; 28 cm
- Place of Publication:
- New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, [1977]
- Notes:
- "77CH 1261-7C."
- Includes bibliographical references.
- OCLC:
- 3593732
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