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Proceedings : ATFA-77, Advanced Techniques in Failure Analysis, 27-29 September 1977, Airport Marriott Hotel, Los Angeles, California USA / sponsored by The Institute of Electrical and Electronics Engineers, (IEEE) Los Angeles Council/Region 6, Los Angeles, The International Metallographic Society.
LIBRA TK7871.85 .A38 1977
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Advanced Techniques in Failure Analysis Symposium, Los Angeles, Calif., 1977.
- Language:
- English
- Subjects (All):
- Semiconductors--Defects--Congresses.
- Semiconductors.
- Semiconductors--Defects.
- Semiconductors--Testing--Congresses.
- Semiconductors--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- viii, 345 pages : illustrations ; 29 cm
- Other Title:
- Advanced techniques in failure analysis.
- Place of Publication:
- New York : Institute of Electrical and Electronics Engineers, [1977]
- Notes:
- "IEEE Catalog no. 77CH1248-4REG6."
- Includes bibliographical references.
- OCLC:
- 80895972
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