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High-resolution X-ray scattering from thin films to lateral nanostructures / Ullrich Pietsch, Václav Holý, Tilo Baumbach.
LIBRA QC176.84.O7 P54 2004
Available from offsite location
LIBRA QC176.84.O7 P54 2004
Available from offsite location
- Format:
- Book
- Author/Creator:
- Pietsch, Ullrich, 1952-
- Series:
- Advanced texts in physics
- Language:
- English
- Subjects (All):
- Thin films--Optical properties.
- Thin films.
- X-rays--Scattering.
- X-rays.
- X-rays--Diffraction.
- Nanostructured materials.
- Physical Description:
- xvi, 408 pages : illustrations ; 25 cm.
- Edition:
- Second edition.
- Place of Publication:
- New York : Springer-Verlag, 2004.
- Notes:
- Includes bibliographical references (pages [389]-402) and index.
- Local Notes:
- Acquired for the Penn Libraries with assistance from the Louis A. Duhring Fund.
- ISBN:
- 0387400923
- OCLC:
- 53903576
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