Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].

Format:

Book

Contributor:

Bhushan, Bharat, 1949-

Fuchs, H. (Harald)

Hosaka, Sumio

Rosengarten Family Fund.

Series:

Nanoscience and technology

Language:

English

Subjects (All):

Materials--Microscopy.

Materials.

Scanning probe microscopy.

Physical Description:

v : illustrations ; 24 cm.

Place of Publication:

Berlin ; New York : Springer, c2004-

Summary:

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology. Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Contents:

[1. Without special title]

2. Scanning probe microscopy techniques

3. Characterization

4. Industrial applications

5. Scanning probe microscopy techniques

6. Characterization

7. Biomimetics and industrial applications

8. Scanning probe microscopy techniques

Notes:

Editors vary.

Includes bibliographical references and index.

Local Notes:

Acquired for the Penn Libraries with assistance from the Rosengarten Family Fund.

ISBN:

3540005277

9783540005278

3540262423

9783540262428

3540269096

9783540269090

3540269126

9783540269120

3540373152

9783540373155

3540373187

9783540373186

3540373209

9783540373209

OCLC:

70706866