Nanoscale phenomena in ferroelectric thin films / edited by Seungbum Hong.

Format:

Book

Contributor:

Hong, Seungbum.

Language:

English

Subjects (All):

Ferroelectric thin films.

Nanostructured materials.

Physical Description:

xiv, 288 pages : illustrations ; 25 cm

Place of Publication:

Boston : Kluwer Academic Publishers, [2004]

Contents:

Part I. Electrical Characterization in Nanoscale Ferroelectric Capacitor

I. Testing and characterization of ferroelectric thin film capacitors / In Kyeong. Yoo

1. Test Circuits 3

2. Hysteretic Property 5

3. Capacitance and Current 9

4. Stored Energy 9

5. Ageing 11

6. Fatigue 13

7. Imprint 14

8. Leakage Current 16

9. Electrical Degradation 21

10. Breakdown 22

11. Pyroelectric Effect 26

12. Additional tests for commercial memory cells 29

II. Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size / Igor Stolichnov

2. Size effects: role of the ferroelectric film thickness, impact of the passive layer and local charge injection 40

3. Size effects: role of the capacitor size and impact of nonhomogeneous stress 48

III. Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy / Alexei Gruverman

2. Experimental Approach 59

3. Variations in Ferroelectric Properties at the nanoscale 65

4. PFM studies of retention behavior 74

5. Nanoscale Leakage Current Mapping 81

IV. Nanoscale domain dynamics in ferroelectric thin films / V. Nagarajan, R. Ramesh

2. Thin Film Materials and Characterization 89

3. Polarization Relaxation at the Nanoscale 92

4. Nanoscale Piezoelectric and Ferroelectric Behavior 97

V. Polarization switching and fatigue of ferroelectric thin films studied by PFM / Seungbum Hong

2. Polarization switching 114

3. Fatigue: suppression of switchable polarization 126

Part II. Nano Domain Manipulation and Visualization in Ferroelectric Materials

VI. Domain switching and self-polarization in perovskite thin films / A. Roelofs, K. Szot, R. Waser

2. PTO polycrystalline thin films on platinized silicon wafers 136

3. PTO single grains 140

4. Epitaxial PZT thin films on STO/LSCO 142

5. The origin of self-polarization 146

VII. Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain / Z. G. Khim, J. Hong

2. Detection Mechanism of DC-EFM 160

3. Observation of Ferroelectric Domains 165

4. Control of ferroelectric domains 174

VIII. Polarization and charge dynamics in ferroelectric materials with SPM / S. Kalinin, D. A. Bonnell

2. Principles of Non-contact Electrostatic SPMs 185

3. Domain Structure Reconstruction from SPM 186

4. Origins of Domain Contrast in EFM and SSPM 189

5. Polarization and Charge Dynamics on the BaTiO[subscript 3] (100) Surface 196

6. Screening and Thermodynamics of Adsorption on BaTiO[subscript 3] (100) Surfaces 204

7. Domain Selective Photochemical Activity on Ferroelectric Surfaces 209

IX. Nanoscale investigation of MOCVD-Pb(Zr,Ti)O[subscript 3] thin films using scanning probe microscopy / Hironori Fujisawa, Masaru Shimizu

2. Experimental procedure 220

3. Local Current Flow of PZT Thin Films 222

4. Crystalline Structure and Ferroelectric Properties of Nanosized PZT Islands 225

5. Polarization Switching Processes in Epitaxial PZT Thin Films 228

X. SPM measurements of ferroelectrics at MHz frequencies / Bryan. D. Huey

2. Sensitivity to cantilever Loading 240

3. Periodic excitation and detection 248

4. MHz measurement Techniques at the Nanoscale 252

XI. Application of ferroelectric domains in nanometer scale for high-density storage devices / Hyunjung Shin

2. MEMS technology and Probe-based storage systems 265

3. Ferroelectric Domain writing and reading in nanometer scale 270

4. Research Issues and perspective of ferroelectric domains for storage applications 275.

Notes:

Includes bibliographical references and index.

ISBN:

1402076304

OCLC:

53091189