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Spatially resolved characterization of local phenomena in materials and devices : symposium held December 2-6, 2002, Boston, Massachusetts / editors, Javier Piqueras ... [and others].
LIBRA T174.7 .S96 2002
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 : Boston, Mass.)
- Series:
- Materials Research Society symposia proceedings ; v. 738.
- Materials Research Society symposia proceedings
- Language:
- English
- Subjects (All):
- Nanotechnology--Congresses.
- Nanotechnology.
- Nanostructured materials--Congresses.
- Nanostructured materials.
- Semiconductors--Characterization--Technique--Congresses.
- Semiconductors.
- Scanning probe microscopy--Congresses.
- Scanning probe microscopy.
- Semiconductors--Characterization.
- Technique.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiii, 425 pages : illustrations ; 24 cm.
- Place of Publication:
- Warrendale, Pa. : Materials Research Society, [2003]
- Notes:
- Includes bibliographical references and indexes.
- Local Notes:
- Acquired for the Penn Libraries with assistance from the Alumni and Friends Memorial Book Fund.
- ISBN:
- 1558996753
- OCLC:
- 249384463
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