2 options
Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [and others].
Van Pelt Library QH212.S3 S29 2003 1 v. + disc
Available
Chemistry Library - Books QH212.S3 S29 2003 1 v. + CD-ROM
Available
- Format:
- Book
- Language:
- English
- Subjects (All):
- Scanning electron microscopy.
- X-ray microanalysis.
- Physical Description:
- xix, 689 pages : illustrations (some color) ; 26 cm + 1 CD-ROM (4 3/4 in.)
- 4 3/4 in.
- Edition:
- Third edition.
- Place of Publication:
- New York : Kluwer Academic/Plenum Publishers, [2003]
- System Details:
- text file
- Summary:
- Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters." -- p. [4] of cover.
- Notes:
- Includes bibliographical references and index.
- Local Notes:
- Acquired for the Penn Libraries with assistance from the Louis A. Duhring Fund.
- ISBN:
- 0306472929
- OCLC:
- 50339282
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