Handbook of X-ray spectometry / edited by René E. Van Grieken, Andrzej A. Markowicz.

Format:

Book

Contributor:

Grieken, R. van (René)

Markowicz, Andrzej

Rosengarten Family Fund.

Series:

Practical spectroscopy ; v. 29.

Practical spectroscopy

Language:

English

Subjects (All):

X-ray spectroscopy.

Spectrometry, X-Ray Emission--methods.

Medical Subjects:

Spectrometry, X-Ray Emission--methods.

Physical Description:

xvi, 983 pages : illustrations ; 26 cm.

Edition:

Second edition, revised and expanded.

Place of Publication:

New York : Marcel Dekker, [2002]

Contents:

1 X-ray Physics / Andrzej A. Markowicz 1

II. History 1

IV. Emission of Continuous Radiation 3

V. Emission of Characteristic X-rays 7

VI. Interaction of Photons with Matter 17

VII. Intensity of Characteristic X-rays 31

VIII. IUPAC Notation for X-ray Spectroscopy 34

I. Critical Absorption Wavelengths and Critical Absorption Energies 36

II. Characteristic X-ray Wavelengths (A) and Energies (keV) 40

III. Radiative Transition Probabilities 49

IV. Natural Widths of K and L Levels and K[subscript a] X-ray Lines (FWHM), in eV 53

V. Wavelengths of K Satellite Lines (A) 56

VI. Fluorescence Yields and Coster-Kronig Transition Probabilities 58

VII. Coefficients for Calculating the Photoelectric Absorption Cross Sections [tau] (Barns/Atom) Via ln-ln Representation 68

VIII. Coefficients for Calculating the Incoherent Collision Cross Sections [sigma subscript c] (Barns/Atom) Via the ln-ln Representation 74

IX. Coefficients for Calculating the Coherent Scattering Cross Sections [sigma subscript R] (Barns/Atom) Via the ln-ln Representation 76

X. Parameters for Calculating the Total Mass Attenuation Coefficients in the Energy Range 0.1-1000 keV [Via Eq. (78)] 78

XI. Total Mass Attenuation Coefficients for Low-Energy K[alpha] Lines 87

XII. Correspondence Between Old Siegbahn and New IUPAC Notation X-ray Diagram Lines 91

2 Wavelength-Dispersive X-ray Fluorescence / Jozef A. Helsen, Andrzej Kuczumow 95

II. Fundamentals of Wavelength Dispersion 100

III. Layout of a Spectrometer 104

IV. Qualitative and Quantitative Analysis 150

V. Chemical Shift and Speciation 169

VI. Instrumentation 173

VII. Future Prospects 189

3 Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation / Andrew T. Ellis 199

II. X-ray Tube Excitation Systems 200

III. Semiconductor Detectors 214

IV. Semiconductor Detector Electronics 230

4 Spectrum Evaluation / Piet Van Espen 239

III. Spectrum Processing Methods 245

IV. Continuum Estimation Methods 260

V. Simple Net Peak Area Determination 264

VI. Least-Squares Fitting Using Reference Spectra 268

VII. Least-Squares Fitting Using Analytical Functions 278

VIII. Methods Based on the Monte Carlo Technique 300

IX. The Least-Squares-Fitting Method 306

X. Computer Implementation of Various Algorithms 315

5 Quantification of Infinitely Thick Specimens by XRF Analysis / Johan L. de Vries, Bruno A. R. Vrebos 341

II. Correlation Between Count Rate and Specimen Composition 343

III. Factors Influencing the Accuracy of the Intensity Measurement 350

IV. Calibration and Standard Specimens 359

V. Converting Intensities to Concentration 362

6 Quantification in XRF Analysis of Intermediate-Thickness Samples / Andrzej A. Markowicz, Rene E. Van Grieken 407

II. Emission-Transmission Method 408

III. Absorption Correction Methods Via Scattered Primary Radiation 415

IV. Quantitation for Intermediate-Thickness Granular Specimens 423

7 Radioisotope-Excited X-ray Analysis / Stanislaw Piorek 433

II. Basic Equations 435

III. Radioisotope X-ray Sources and Detectors 442

IV. X-ray and [gamma]-ray Techniques 456

V. Factors Affecting the Overall Accuracy of XRF Analysis 469

VI. Applications 474

VII. Future of Radioisotope-Excited XRF Analysis 495

Appendix List of Companies that Manufacture Radioisotope-Based X-ray Analyzers and Systems 497

8 Synchrotron Radiation-Induced X-ray Emission / Keith W. Jones 501

II. Properties of Synchrotron Radiation 503

III. Description of Synchrotron Facilities 506

IV. Apparatus for X-ray Microscopy 507

V. Continuum and Monochromatic Excitation 523

VI. Quantitation 524

VII. Sensitivities and Minimum Detection Limits 525

VIII. Beam-Induced Damage 530

IX. Applications of SRIXE 532

X. Tomography 542

XI. EXAFS and XANES 545

XII. Future Directions 551

9 Total Reflection X-ray Fluorescence / Peter Kregsamer, Christina Streli, Peter Wobrauschek 559

II. Physical Principles 560

III. Instrumentation 567

IV. Chemical Analysis 574

V. Surface Analysis 583

VI. Thin Films and Depth Profiles 588

VII. Synchrotron Radiation Excitation 590

VIII. Light Elements 595

IX. Related Techniques 597

10 Polarized Beam X-ray Fluorescence Analysis / Joachim Heckel, Richard W. Ryon 603

II. Theory 605

III. Barkla Systems 610

IV. Bragg Systems 618

V. Barkla-Bragg Combination Systems 627

VI. Secondary Targets 627

11 Microbeam XRF / Anders Rindby, Koen H. A. Janssens 631

I. Introduction and Historical Perspective 631

II. Theoretical Background 637

III. Instrumentation for Microbeam XRF 646

IV. Collection and Processing of [mu]-XRF Data 667

V. Applications 696

12 Particle-Induced X-ray Emission Analysis / Willy Maenhaut, Klas G. Malmqvist 719

II. Interactions of Charged Particles with Matter, Characteristic X-ray Production, and Continuous Photon Background Production 720

III. Instrumentation 727

IV. Quantitation, Detection Limits, Accuracy, and Precision 739

V. Sample Collection and Sample and Specimen Preparation for PIXE Analysis 748

VI. Applications 750

VII. Complementary Ion-Beam-Analysis Techniques 783

13 Electron-Induced X-ray Emission / John A. Small, Dale E. Newbury, John T. Armstrong 811

II. Quantitative Analysis 816

III. Microanalysis at Low Electron Beam Energy 857

IV. Analysis of Samples with Nonstandard Geometries 876

V. Spatially Resolved X-ray Analysis 909

14 Sample Preparation for X-ray Fluorescence / Martina Schmeling, Rene E. Van Grieken 933

II. Solid Samples 934

III. Fused Specimen 944

IV. Liquid Specimen 948

V. Biological Samples 958

VI. Atmospheric Particles 965

VII. Sample Support Materials 968.

Notes:

First ed. published as: Handbook of x-ray spectrometry : methods and techniques, 1993.

Includes bibliographical references and index.

Local Notes:

Acquired for the Penn Libraries with assistance from the Rosengarten Family Fund.

ISBN:

0824706005

OCLC:

48383556