1 option
Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen.
LIBRA QD921 .N38 1979
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England)
- Series:
- NATO advanced study institutes series. Physics ; Series B, v. 63.
- NATO advanced study institutes series. Series B, Physics ; v. 63
- Language:
- English
- Subjects (All):
- Crystals--Defects--Congresses.
- Crystals.
- Crystals--Defects.
- X-ray crystallography--Congresses.
- X-ray crystallography.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxvi, 589 pages : illustrations ; 26 cm.
- Place of Publication:
- New York, N.Y. : Plenum Press, [1980]
- Notes:
- "Published in cooperation with NATO Scientific Affairs Division."
- Includes bibliographical references and index.
- ISBN:
- 0306406284
- OCLC:
- 6942201
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.