Electron backscatter diffraction in materials science / edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.

Format:

Book

Contributor:

Schwartz, Adam J.

Kumar, Mukul.

Adams, B. L. (Brent L.)

Language:

English

Subjects (All):

Materials--Microscopy.

Materials.

Scanning electron microscopy.

Crystallography.

Physical Description:

xvi, 339 pages : illustrations ; 26 cm

Place of Publication:

New York : Kluwer Academic, [2000]

Contents:

1 The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy / David J. Dingley 1

1.3 The earliest work 2

1.4 The first diffraction experiments in the SEM 4

1.5 Computer assisted indexing of EBSD 5

1.6 Fully automated indexing of EBSD patterns 7

1.7 Orientation imaging microscopy 7

1.8 EBSD image quality 9

1.9 EBSD, spatial resolution 11

1.10 EBSD for phase identification 13

1.11 The move to the transmission electron microscope 14

2 Theoretical Framework for Electron Backscatter Diffraction / Valerie Randle 19

2.2 Formation and interpretation of the EBSD Kikuchi patterns 20

2.3 Crystallographic terms of reference for EBSD 25

2.4 Descriptors of orientation and misorientation 28

3 Representations of Texture in Orientation Space / Krishna Rajan 31

3.2 Stereographic projections 31

3.3 Pole figures from EBSD 32

3.4 Inverse pole figures from EBSD 33

3.5 Orientation distribution functions and Euler space 34

4 Rodrigues-Frank Representations of Crystallographic Texture / Krishna Rajan 39

4.2 Geometrical characteristics of Rodrigues-Frank space 40

4.3 Fiber textures 42

4.4 Lattice symmetry-sample symmetry coupling 44

4.5 Crystallographic statistics and clustering in R-F space 46

4.6 Grain boundary texture 47

5 Fundamentals of Automated EBSD / Stuart I. Wright 51

5.2 Image processing 51

5.3 Zone axis indexing 53

5.4 Band detection 53

5.5 Automatic indexing 58

5.6 Structure definition 60

5.7 Calibration 61

6 Studies on the Accuracy of Electron Backscatter Diffraction Measurements / Melik C. Demirel, Bassem S. El-Dasher, Brent L. Adams, Anthony D. Rollett 65

6.3 Definition of disorientation correlation function (DCF) 66

6.4 Accuracy of orientation measurements 68

6.5 Results 68

7 Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Joseph R. Michael 75

7.2 Phase identification procedure 76

7.3 Examples of phase identification studies 78

7.4 Structure determination from EBSD patterns 80

8 Three-Dimensional Orientation Imaging / Dorte Juul Jensen 91

8.2 The 3D x-ray diffraction microscope 92

8.3 Orientation determination 94

8.4 Applications 96

9 Automated Electron Backscatter Diffraction: Present State and Prospects / Robert A. Schwarzer 105

9.2 The interpretation of backscatter Kikuchi patterns 106

9.3 Experimental setup of a modern EBSD system 110

9.4 The components of an automated EBSD system 111

9.5 The evaluation of grain orientation data 120

10 EBSD: Buying a System / Alwyn Eades 123

10.1 Should you build your own system? 123

10.2 What camera should you use? 124

10.3 Which is the best microscope for EBSD? 124

10.4 Which software? 125

10.5 Software criteria 125

11 Hardware and Software Optimization for Orientation Mapping and Phase Identification / Patrick P. Camus 127

11.3 Crystal orientation mapping optimizations 128

11.4 Phase identification optimization 131

11.5 EBSD options 133

12 An Automated EBSD Acquistion and Processing System / Pierre Rolland, Keith G. Dicks 135

12.2 Electron image and pattern acquisition 135

12.3 Data processing 140

13 Advanced Software Capabilities for Automated EBSD / Stuart I. Wright, David P. Field, David J. Dingley 141

13.2 Data collection 141

13.3 Data analysis 146

14 Strategies for Analyzing EBSD Datasets / Wayne E. King, James S. Stolken, Mukul Kumar, Adam J. Schwartz 153

14.2 Data analysis strategies: 2-D 153

14.3 Data analysis strategies: 3-D 165

15 Structure-Property Relations: EBSD-Based Material-Sensitive Design / Brent L. Adams, Benjamin L. Henrie, Larry L. Howell, Richard J. Balling 171

15.2 Structure-properties relationships 172

15.3 Material sensitive design 176

16 Use of EBSD Data in Mesoscale Numerical Analyses / Richard Becker, Hasso Weiland 181

16.2 Crystal plasticity model 182

16.3 Crystal model validation 187

17 Characterization of Deformed Microstructures / David P. Field, Hasso Weiland 199

17.2 Cold-rolled pure aluminum 201

17.3 Equal-channel extruded and cold-rolled copper 205

17.4 Friction stir welding in aluminum 207

18 Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium / John F. Bingert, Thomas A. Mason, George C. Kaschner, Paul J. Maudlin, George T. Gray III 213

18.2 Tantalum 214

18.3 Zirconium 221

19 Measuring Strains Using Electron Backscatter Diffraction / Angus J. Wilkinson 231

19.3 Plastic deformation 233

19.4 Elastic deformation 238

20 Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction / Edward M. Lehockey, Yang-Pi Lin, Olev E. Lepik 247

20.2 Misorientation density distributions 248

20.3 Quantifying strains by misorientation density 250

20.4 Mapping the spatial distribution of strain fields 256

20.5 Applications 258

21 EBSD Contra Tem Characterization of a Deformed Aluminum Single Crystal / Xiaoxu Huang, Dorte Juul Jensen 265

21.2 Experimental procedures 267

21.3 Results 267

22 Continuous Recrystallization and Grain Boundaries in a Superplastic Aluminum Alloy / Terry R. McNelley 277

22.2 The material and method of EBSD examination 279

22.3 The grain boundary character of Supral 2004 281

23 Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction / Valerie Randle 291

23.2 Investigation methodology 291

23.3 Data analysis 296

23.4 Three-dimensional microtexture 297

24 EBSD of Ceramic Materials / Jeffrey K. Farrer, Joseph R. Michael, C. Barry Carter 299

24.2 Challenge of ceramic materials for EBSD 300

24.3 Examples of applications to ceramics 303

24.4 Similar problems 303

24.5 Special problems for ceramics 306

24.6 Thin-film reactions 308

24.7 Grain boundary migration 312

24.8 Grain boundary energies and grooving 314

25 Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires / Amit Goyal 319

25.2 First generation HTS wires 322

25.2 Second generation HTS wires 328.

Notes:

Includes bibliographical references and index.

ISBN:

030646487X

OCLC:

44619481