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Scanning probe microscopy and spectroscopy : theory, techniques, and applications / edited by Dawn A. Bonnell.

Van Pelt Library QH212.S33 S38 2001
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Format:
Book
Contributor:
Bonnell, Dawn A.
Language:
English
Subjects (All):
Scanning probe microscopy.
Tunneling spectroscopy.
Physical Description:
xiv, 493 pages, 4 unnumbered pages of plates : illustrations (some color) ; 25 cm
Edition:
Second edition.
Place of Publication:
New York : Wiley-VCH, [2001]
Summary:
Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Notes:
Rev. ed. of: Scanning tunneling microscopy and spectroscopy. c1993.
Includes bibliographical references and index.
ISBN:
047124824X
OCLC:
43798382

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