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In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.
LIBRA QC176.83 .I5 2000
Available from offsite location
- Format:
- Book
- Language:
- English
- Subjects (All):
- Thin films.
- Physical Description:
- xi, 263 pages : illustrations ; 25 cm
- Place of Publication:
- New York : Wiley, [2001]
- Summary:
- * And other cost-effective techniques for industrial application
- Notes:
- "A Wiley-Interscience publication."
- Includes bibliographical references.
- ISBN:
- 0471241415
- OCLC:
- 43552632
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