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New horizons in testing : latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock ... [and others].
- Format:
- Book
- Conference/Event
- Conference Name:
- Computerized Adaptive Testing Conference (1979 : Wayzata, Minn.)
- Language:
- English
- Subjects (All):
- Psychological tests--Congresses.
- Psychological tests.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xvii, 345 pages : illustrations ; 24 cm
- Place of Publication:
- New York : Academic Press, 1983.
- Notes:
- Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
- Includes bibliographies and indexes.
- ISBN:
- 0127427805
- OCLC:
- 9112130
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