My Account Log in

1 option

Techniques of electron microscopy, diffraction, and microprobe analysis. / Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963.

LIBRA 669.95 Sy65
Loading location information...

Available from offsite location This item is stored in our repository but can be checked out.

Log in to request item
Format:
Book
Conference/Event
Contributor:
American Society for Testing and Materials. Committee E-4 on Metallography.
Conference Name:
Symposium on Advances in Electron Metallography Atlantic City, 1963.
Series:
ASTM special technical publication ; 372.
ASTM special technical publication ; no.372
Language:
English
Subjects (All):
Metallography--Congresses.
Metallography.
Electron microscopes--Congresses.
Electron microscopes.
Genre:
Conference papers and proceedings.
Physical Description:
vi, 89 pages : illustrations ; 24cm.
Place of Publication:
Philadelphia : American Society for Testing and Materials, [1965, c1964]
Notes:
Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography.
Includes bibliographical references.
OCLC:
2144643

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account