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Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
LIBRA QH212.S3 R452 1998
Available from offsite location
- Format:
- Book
- Author/Creator:
- Reimer, Ludwig, 1928-
- Series:
- Springer series in optical sciences ; v. 45.
- Springer series in optical sciences ; v. 45
- Language:
- English
- Subjects (All):
- Scanning electron microscopy.
- Physical Description:
- xiv, 527 pages : illustrations ; 25 cm.
- Edition:
- Second completely revised and updated edition.
- Place of Publication:
- Berlin ; New York : Springer, [1998]
- Summary:
- Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 3540639764
- OCLC:
- 39281893
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