Digest of papers / International Test Conference.

Format:

Conference/Event

Journal/Periodical

Contributor:

IEEE Computer Society. Test Technology Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Conference Name:

International Test Conference.

Language:

English

Subjects (All):

Integrated circuits--Large scale integration--Congresses.

Integrated circuits.

Integrated circuits--Testing--Congresses.

Semiconductor storage devices--Testing--Congresses.

Semiconductor storage devices.

Semiconductor storage devices--Testing.

Congresses and conventions.

Integrated circuits--Large scale integration.

Physical Description:

2 volumes : illustrations ; 28 cm

1981-1982.

Other Title:

IEEE....Test Conference

Continues:

Test Conference. Digest of papers / Test Conference

Continued By:

International Test Conference. Proceedings

Place of Publication:

New York : Institute of Electrical and Electronics Engineers, 1981-1982.

Notes:

Each conference has also a distinctive title.

Conferences for 1981-1982 sponsored by the IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE.

OCLC:

213808060