Digest of papers / International Test Conference.

Format:

• Conference/Event
• Journal/Periodical

Contributor:

• IEEE Computer Society. Test Technology Committee.
• Institute of Electrical and Electronics Engineers. Philadelphia Section.

Conference Name:

• International Test Conference.

Language:

English

Subjects (All):

• Integrated circuits--Large scale integration--Congresses.
• Integrated circuits--Testing--Congresses.
• Semiconductor storage devices--Testing--Congresses.
• Semiconductor storage devices--Testing.
• Congresses and conventions.
• Semiconductor storage devices.
• Integrated circuits--Large scale integration.

Physical Description:

• 2 volumes : illustrations ; 28 cm
• 1981-1982.

Other Title:

IEEE....Test Conference

Continues:

• Test Conference. Digest of papers / Test Conference

Continued By:

• International Test Conference. Proceedings

Place of Publication:

New York : Institute of Electrical and Electronics Engineers, 1981-1982.

Notes:

• Each conference has also a distinctive title.
• Conferences for 1981-1982 sponsored by the IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE.

OCLC:

213808060