Digest of papers / Test Conference.

Format:

Conference/Event

Journal/Periodical

Contributor:

IEEE Computer Society. Test Technology Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Conference Name:

Test Conference.

Language:

English

Subjects (All):

Semiconductor storage devices--Testing--Congresses.

Semiconductor storage devices.

Integrated circuits--Testing--Congresses.

Integrated circuits.

Integrated circuits--Large scale integration--Congresses.

Integrated circuits--Large scale integration.

Congresses and conventions.

Semiconductor storage devices--Testing.

Physical Description:

2 volumes : illustrations ; 28 cm

1979-80.

Other Title:

IEEE ... Semiconductor Test Conference 1979

IEEE ... Test Conference 1980

Continues:

Semiconductor Test Symposium. Digest of papers

Continued By:

International Test Conference. Digest of papers /International Test Conference

Place of Publication:

[New York] : Institute of Electrical and Electronics Engineers, 1979-

Notes:

Each issue has also a distinctive title.

Conferences for 1979- sponsored by: IEEE Computer Society, Test Technology Committee, and Philadelphia Section of IEEE.

OCLC:

7201481