1 option
Delay fault testing for VLSI circuits / Angela Krstić, Kwang-Ting (Tim) Cheng.
LIBRA TK7874.75 .K77 1998
Available from offsite location
- Format:
- Book
- Author/Creator:
- Krstić, Angela, 1965-
- Series:
- Frontiers in electronic testing
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing.
- Integrated circuits.
- Delay faults (Semiconductors).
- Physical Description:
- xii, 191 pages : illustrations ; 24 cm.
- Place of Publication:
- Boston : Kluwer Academic Publishers, [1998]
- Notes:
- Includes bibliographical references (pages [173]-188) and index.
- Local Notes:
- Acquired for the Penn Libraries with assistance from the Class of 1939 Fund.
- ISBN:
- 0792382951
- OCLC:
- 39706873
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.