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Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.
LIBRA TK7874 .K867 1998
Available from offsite location
- Format:
- Book
- Author/Creator:
- Kuo, Way, 1951-
- Language:
- English
- Subjects (All):
- Integrated circuits--Design and construction--Reliability.
- Integrated circuits.
- Microelectronics--Reliability.
- Microelectronics.
- Computer software--Development--Reliability.
- Computer software.
- Semiconductors--Computer programs--Reliability.
- Semiconductors.
- Semiconductors--Computer programs.
- Computer software--Development.
- Integrated circuits--Design and construction.
- Physical Description:
- xxvi, 394 pages : illustrations ; 24 cm
- Place of Publication:
- Boston, Mass : Kluwer Academic Publishers, [1998]
- Notes:
- Includes bibliographical references (pages [333]-361) and index.
- ISBN:
- 0792381076
- OCLC:
- 37878683
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