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A unified approach for timing verification and delay fault testing / Mukund Sivaraman and Andrzej J. Strojwas.
LIBRA TK7874.65 .S58 1998
Available from offsite location
- Format:
- Book
- Author/Creator:
- Sivaraman, Mukund, 1970-
- Language:
- English
- Subjects (All):
- Digital integrated circuits--Design and construction--Data processing.
- Digital integrated circuits.
- Digital integrated circuits--Testing.
- Electric fault location.
- Integrated circuits--Verification.
- Integrated circuits.
- Physical Description:
- xv, 155 pages : illustrations ; 25 cm
- Place of Publication:
- Boston : Kluwer Academic, [1998]
- Notes:
- Includes bibliographical references (pages [139]-152) and index.
- ISBN:
- 0792380797
- OCLC:
- 37713039
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