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Applications of x-ray topographic methods to materials science / edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
LIBRA TA417.25 .F73 1983
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science (1983 : Snowmass Village, Colo.)
- Language:
- English
- Subjects (All):
- Radiography, Industrial--Congresses.
- Radiography, Industrial.
- X-rays--Industrial applications--Congresses.
- X-rays--Industrial applications.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiii, 536 pages : illustrations ; 26 cm
- Place of Publication:
- New York : Plenum Press, [1984]
- Notes:
- "Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso.
- Includes bibliographies and index.
- ISBN:
- 030641838X
- OCLC:
- 11187686
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