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From contamination to defects, faults, and yield loss : simulation and applications / by Jitendra B. Khare, Wojciech Maly.
LIBRA TK7874.75 .K47 1996
Available from offsite location
- Format:
- Book
- Author/Creator:
- Khare, Jitendra B.
- Series:
- Frontiers in electronic testing
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Defects.
- Integrated circuits--Very large scale integration--Computer simulation.
- Cimputer-aided design.
- Integrated circuits--Very large scale integration.
- Physical Description:
- 150 pages : illustrations ; 24 cm.
- Place of Publication:
- Boston : Kluwer Academic Publishers, [1996]
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 0792397142
- OCLC:
- 34284663
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