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Testability concepts for digital ICs : the macro test approach / by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
LIBRA TK7874.65 .B44 1996
Available from offsite location
- Format:
- Book
- Author/Creator:
- Beenker, F. P. M. (Frans P. M.)
- Series:
- Frontiers in electronic testing
- Language:
- English
- Subjects (All):
- Digital integrated circuits--Testing.
- Digital integrated circuits.
- Automatic test equipment.
- Physical Description:
- ix, 212 pages : illustrations ; 25 cm.
- Place of Publication:
- Dordrecht ; Boston : Kluwer Academic Publishers, [1995]
- Notes:
- Includes bibliographical references (pages 197-205).
- ISBN:
- 0792396588
- OCLC:
- 33244425
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