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Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California / Fred H. Pollak, chairman/editor.
LIBRA TK7871.85 .S725 1985
Available from offsite location
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 524.
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 524
- Language:
- English
- Subjects (All):
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Spectrum analysis--Congresses.
- Spectrum analysis.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vi, 169 pages : illustrations ; 28 cm.
- Place of Publication:
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1985]
- Notes:
- Includes bibliographies and index.
- ISBN:
- 0892525592
- OCLC:
- 12307424
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