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The influence of interface structure -- homogeneous and inhomogeneous -- on the Schottky barrier height and electrical properties of metal/semiconductor contacts / John P. Sullivan.

LIBRA Diss. POPM1993.433
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LIBRA TN001 1993 .S949
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LIBRA Microfilm P38:1993
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Format:
Book
Manuscript
Microformat
Thesis/Dissertation
Author/Creator:
Sullivan, John P.
Language:
English
Subjects (All):
Penn dissertations--Materials science and engineering.
Materials science and engineering--Penn dissertations.
Local Subjects:
Penn dissertations--Materials science and engineering.
Materials science and engineering--Penn dissertations.
Physical Description:
xiv, 217 leaves : illustrations ; 29cm
Production:
1993.
Notes:
Thesis (Ph.D. in Materials Science and Engineering) -- Graduate School of Arts and Sciences, University of Pennsylvania, 1993.
Includes bibliographical references.
Local Notes:
University Microfilms order no.:94-13913
OCLC:
187457261

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