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Statistical approach to VLSI / [edited by] S.W. Director, W. Maly.
LIBRA TK7874.75 .S86 1994
Available from offsite location
- Format:
- Book
- Series:
- Advances in CAD for VLSI ; v. 8.
- Advances in CAD for VLSI ; v. 8
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Defects.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction--Statistical methods.
- Mathematical optimization.
- Integrated circuits--Very large scale integration--Design and construction.
- Statistics.
- Integrated circuits--Very large scale integration.
- Physical Description:
- x, 391 pages : illustrations ; 25 cm.
- Place of Publication:
- Amsterdam ; New York : North-Holland, 1994.
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 0444883711
- OCLC:
- 29517645
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