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High-power GaAs FET amplifiers / John L.B. Walker, editor.
LIBRA TK7871.58.P6 W35 1993
Available from offsite location
- Format:
- Book
- Series:
- Artech House microwave library
- The Artech House microwave library
- Language:
- English
- Subjects (All):
- Power amplifiers.
- Metal semiconductor field-effect transistors.
- Gallium arsenide semiconductors.
- Microwave integrated circuits.
- Physical Description:
- xii, 369 pages : illustrations ; 24 cm.
- Place of Publication:
- Boston : Artech House, [1993]
- Contents:
- 1.2 Analysis of Ideal GaAs FET Class A and B Amplifiers 3
- 1.2.1 Device Physics Versus Circuit Design Viewpoint 3
- 1.2.2 Class A Amplifiers 4
- 1.2.3 Single-Ended Class B Amplifiers With Resistive Load 11
- 1.2.4 Single-Ended Class B Amplifiers With Tuned Load 15
- 1.2.5 Push-Pull Class B Amplifiers 18
- 1.2.6 Comparison of the Various Types of Power Amplifiers 21
- 1.2.7 Validity of the Preceding Analysis 21
- 1.3 The Concept of Power per Millimeter of Gatewidth 23
- 1.4 Small-Signal (Linear) and Large-Signal (Nonlinear) Models for an FET 24
- 1.5 Overview of Design Techniques 30
- 1.6 Bandwidth Limitations of Reactively Matched Amplifiers 35
- 1.6.1 Output Matching Network 35
- 1.6.2 Input Matching Network 38
- Chapter 2 High-Power GaAs FETs 43
- 2.1.1 The Development of the High-Power GaAs FET 43
- 2.1.2 Current Technology for the High-Power GaAs FET 45
- 2.2 High-Power FET Design: FET Channel Cross-Section Design 48
- 2.2.1 The Flow of the Design Process 48
- 2.2.2 Designing the Epitaxial Wafer Structure 50
- 2.2.3 Determination of the Gate Length 56
- 2.2.4 The Scaling Law 58
- 2.2.5 Breakdown Voltage and Recess Structure 66
- 2.2.6 Parasitic Resistance 72
- 2.2.7 Equivalent Circuits 74
- 2.3 High-Power FET Design: FET Pattern Design 77
- 2.3.1 The Flow of the Design Process 77
- 2.3.2 Output Power and Total Gatewidth 77
- 2.3.3 Determination of the Unit Gatewidth 80
- 2.3.4 Chip Size 83
- 2.3.5 Determination of the Number of Pads 84
- 2.3.6 Pattern Layout 87
- 2.3.7 Chip Backside Structure 90
- 2.4 Thermal Properties 94
- 2.5 Manufacturing 97
- 2.5.1 Epitaxial Wafer Growth 97
- 2.5.2 Flow of the Wafer Manufacturing Process 103
- 2.5.3 Isolation 103
- 2.5.4 Ohmic Electrode Formation 105
- 2.5.5 Gate Electrode Formation 108
- 2.5.6 Protective Layers 111
- 2.5.7 Overlay Wiring 112
- 2.5.8 Backside Processing and Via-Hole Connections 112
- 2.6 Evaluation 113
- 2.6.1 Evaluation of dc Characteristics 113
- 2.6.2 Output Power Measurement 114
- 2.6.3 Measurement of Distortion Features 118
- 2.6.4 Impedance Measurement and Load-Pull Measurement 120
- 2.7 Current FETs 123
- 2.7.1 Standard FET Chips 123
- 2.7.2 Internally Matched FETs 128
- 2.7.3 MMIC Power Amplifiers 134
- 2.8 Trends in Technology 136
- 2.8.1 Material Technology: The InP MISFET 137
- 2.8.2 The Heterojunction FET: HEMT and Heterostructure MISFET 139
- 2.8.3 The Heterojunction Bipolar Transistor 141
- Chapter 3 Computer-Aided Design of GaAs FET Power Amplifiers 147
- 3.2 GaAs FET Nonlinear Models 148
- 3.2.1 The MESFET Large-Signal RF Equivalent Circuit 149
- 3.2.2 The MESFET Static dc Model 162
- 3.2.3 General Guidelines for Large-Signal Model Extraction 172
- 3.3 A Large-Signal Amplifier Simulation 173
- 3.3.1 The FLK202XV Large-Signal Model 173
- 3.3.2 Simulation of the 3.7- to 4.2-GHz, 1-W Class AB Amplifier 174
- Chapter 4 High-Power GaAs FET Amplifier Design 189
- 4.2 Budgeting Transmitting Chain RF Performance 189
- 4.3 Performance Characterization and Modeling 192
- 4.3.1 Pulsed RF Testing 192
- 4.3.2 Bias Points and Class of Operation 194
- 4.3.3 Small-Signal Modeling 195
- 4.4 Design Techniques 198
- 4.4.1 Load-Pull 198
- 4.4.2 Nonlinear CAD 199
- 4.4.3 Modified Cripps Method 199
- 4.5 Scaling 204
- 4.6 Matching Network Design 208
- 4.6.1 Output and Interstage Network Load Line Analysis 209
- 4.6.2 Harmonic Termination Effects 210
- 4.6.3 Stability Considerations 212
- 4.7 Thermal Considerations 212
- 4.8 Gate Current and Insertion Phase 215
- 4.9 Dual-Gate FET Power Amplifier 216
- Chapter 5 Thermal Effects and Reliability 227
- 5.2 Thermal Fundamentals 228
- 5.3 Thermal Calculations for Practical FETs 229
- 5.4 Pulsed Operation 240
- 5.5 Measurement of Thermal Resistance and Channel Temperature 243
- 5.6 Reliability 248
- 5.6.1 Failure Mechanisms 248
- 5.6.2 Reliability Statistics 250
- 5.6.3 Reliability Testing 257
- Chapter 6 Combining Techniques 263
- 6.2 Distributed Amplifier Power Combining 264
- 6.2.1 Small-Signal Analysis 264
- 6.2.2 Effect of Resistive Terminations and Loss Within the FET on Small-Signal Analysis 271
- 6.2.3 Large-Signal Analysis 275
- 6.3 Passive Power Combining/Dividing Networks 281
- 6.3.1 Two-Way In-Phase Power Combiner/Divider Networks 282
- 6.3.2 Two-Way Quadrature-Phase Power Combiner/Divider Networks 285
- 6.3.3 N-Way Power Combiner/Divider Networks 289
- 6.4 Power Combining Methods 292
- 6.4.1 Corporate Power Combining 292
- 6.4.2 Serial Power Combining 302
- 6.4.3 N-Way Power Combining 305
- Chapter 7 Systems Applications of GaAs FET Power Amplifiers 315
- 7.2 Satellite Applications 316
- 7.2.1 Reliability 316
- 7.2.2 Active Phased Arrays 317
- 7.2.3 Power Combined Amplifiers 319
- 7.2.4 Mobile Tactical 321
- 7.2.5 Earth Terminals 328
- 7.3 Terrestrial Telecommunications 331
- 7.3.1 Line-of-Sight Links 332
- 7.3.2 Linearized Amplifiers 332
- 7.4 Radar and EW Applications for High-Power GaAs FET Amplifiers 334.
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 0890064792
- OCLC:
- 26851480
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