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Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
LIBRA QH212.E4 M87 1991
Available from offsite location
- Format:
- Book
- Author/Creator:
- Murr, Lawrence Eugene.
- Series:
- Optical engineering (Marcel Dekker, Inc.) ; v. 29.
- Optical engineering ; 29
- Language:
- English
- Subjects (All):
- Electron microscopy.
- Field ion microscopy.
- Microprobe analysis.
- Physical Description:
- xiv, 837 pages : illustrations ; 26 cm.
- Edition:
- Second edition, revised and expanded.
- Place of Publication:
- New York : M. Dekker, 1991.
- Notes:
- Includes bibliographical references and indexes.
- ISBN:
- 0824785568
- OCLC:
- 23974033
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