1 option
LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE.
LIBRA TK7874 .S418 1978
Available from offsite location
- Format:
- Book
- Conference/Event
- Conference Name:
- Semiconductor Test Conference (1978 : Cherry Hill Township, N.J.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Large scale integration--Congresses.
- Integrated circuits--Large scale integration.
- Printed circuits--Testing--Congresses.
- Printed circuits.
- Printed circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ii, 301 pages : illustrations ; 28 cm
- Place of Publication:
- New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, [1978]
- Notes:
- Includes bibliographical references.
- OCLC:
- 4907530
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.