1 option
Can psychopathology be measured? : [papers] / authors, Ruth Granick Bennett ... [and others]
LIBRA RC455 .C36
Available from offsite location
- Format:
- Book
- Series:
- Annals of the New York Academy of Sciences ; v. 105, art. 15.
- Annals of the New York Academy of Sciences ; v. 105 art. 15
- Language:
- English
- Subjects (All):
- Psychology, Pathological--Congresses.
- Psychology, Pathological.
- Biometry--Congresses.
- Biometry.
- Mental illness--Diagnosis--Congresses.
- Mental illness.
- Mental illness--Diagnosis.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- pages 813-926 : illustrations ; 23 cm.
- Place of Publication:
- New York : New York Academy of Sciences, 1964.
- Notes:
- Cover title.
- "Symposium of the Division of Psychology, New York Academy of Sciences, May 21, 1962."
- Includes bibliographies.
- OCLC:
- 20435745
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